JEOL JSM-6390 (SEM) Scanning Electron Microscope
We offer a 2005 JEOL JSM-6390 Scanning Electron Microscope in excellent working condition and until just recently was under service contract. Can be use for imaging samples with Wet SEM technology. Sold as is, subject to successful inspection.
- Resolution: 3.0nm (at 30kV and 8mm WD)
- Magnification: 5X to 300,000X (163 steps)
- MP-01010(XY) Motorized X and Y axes LGS stage
- MP-34470(BEIW) Backscattering Electron Detector
- R033SP/W Water recirculator
- GW-IRCS-PIP GW Infrared chamberscope
Offers Warmly Accepted.